Avalanche Ruggedness of SiC MPS Diodes Under Repetitive Unclamped-Inductive- Switching Stress - Technical Articles
Reliability investigation of repeated unclamped inductive switching in a diode-clamped SiC circuit breaker - ScienceDirect
Evaluating of the Avalanche Failure of Power MOSFETs using Atlas - Silvaco
Power MOSFET Avalanche Design Guidelines
b) compares the unclamped inductive switching waveforms for the studied... | Download Scientific Diagram
power supply - What is a clamped inductive load? - Electrical Engineering Stack Exchange
TCAD Mixed-Mode Simulation for GaN Power HEMTs in Unclamped Inductive Switching - Silvaco
New Energy Transformation Model for the Unclamped Inductive Switching (UIS) Test
(PDF) Dynamics of power MOSFET switching under unclamped inductive loading conditions | Kevin Fischer - Academia.edu
Figure 2 from Small current unclamped inductive switching (UIS) to detect fabrication defect for mass-production phase IGBT | Semantic Scholar
Typical test setup for unclamped inductive switching. The DUT is in... | Download Scientific Diagram
Avalanche behavior of power MOSFETs under different temperature conditions
Dynamic avalanche behavior of power MOSFETs and IGBTs under unclamped inductive switching conditions
Influences of the Wafer-Level Testing Method on Unclamped Inductive Switching
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Materials | Free Full-Text | Charge Trap States of SiC Power TrenchMOS Transistor under Repetitive Unclamped Inductive Switching Stress
PDF) UIS Characterization of LOCOS-Based LDMOS Transistor Fabricated by 1 µm CMOS Process | Boualem Djezzar - Academia.edu
Unclamped Inductive Switching (UIL) | FocusedTest: Power Discrete Test Solutions
Fayyaz, A. and Yang, L. and Riccio, M. and Castellazzi, A. and Irace, A. (2014) Single pulse avalanche robustness and repetitive
Applied Sciences | Free Full-Text | Analysis of Ruggedness of 4H-SiC Power MOSFETs with Various Doping Parameters
AN1968: Unclamped Inductive Switching (UIS) Test and Rating Methodology
Unclamped Inductive Switching (UIS) test - YouTube
AN-7514 - Single-Pulse Unclamped Inductive Switching: A Rating System
Figure 1 from Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching ( UIS ) Stress Condition | Semantic Scholar
